Multilayer optics for high brightness X-ray sourcesJ. Graf,J. Wiesmann,C. Michaelsen,A. Oehr,C. HoffmannActa Crystallographica Section A(2006)引用 2|浏览5暂无评分关键词X-ray optics,multilayer thin films,single-crystal diffractometryAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要