Voltage Noise in Production Processors

Vijay Janapa Reddi,Svilen Kanev,Wonyoung Kim,Simone Campanoni,Michael D. Smith,Gu-Yeon Wei,David Brooks

IEEE Micro（2011）

引用 38|浏览43

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摘要

Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

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关键词

voltage variation,voltage noise characteristic,resilient architecture design,processor design,duo processor,voltage noise,production core,future system,major challenge,production processors,coprocessors,noise measurement,interference,hardware,multicore processing,computer architecture,integrated circuit design

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