Total reflection X-ray fluorescence in the ultramicro analysis of artists' pigments

The analytical characterization of artists' pigments is very important for art history and for restoration and conservation. Total reflection X-ray fluorescence analysis makes possible the non-destructive analysis of pigments. This new approach complements existing techniques and is unique in being at the same time accurate, fast, inexpensive, and well suited to the screening of pigments used in historical works of art.