Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies

On behalf of the organizing committee, it is our pleasure to welcome you all to the Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies (WREFT), an embedded workshop in the 2008 Computing Frontiers Conference in the beautiful island Ischia. The Technology Roadmap for Semiconductors (ITRS) has identified that beyond 90nm CMOS technology soft errors severely impact field-level product reliability, not only for embedded memory, but for logic as well. Soft errors are upsets with transient effects that can occur in integrated circuits due to the interaction of energetic particles with the circuit substrate. The goal of this half-day workshop is to present the latest research in radiation effects and fault tolerance strategies to provide reliability in nanometer technologies. This includes many research areas, including modeling, testing and designing at device, circuit, system and application levels. The technical program addresses these issues in 5 papers that cover fault tolerance techniques for nanometer technologies from software to layout implementations.