Built-In Current Sensor For Iddq Test
DBT '04: Proceedings of the 2004 IEEE International Workshop on Defect Based Testing（2004）
摘要
A practical Built-in Current Sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 muA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a measurement time of a few milliseconds.
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关键词
built-in self test,electric current measurement,electric sensing devices,integrated circuit testing,BICS design,IDDQ monitoring,IDDQ test,built-in current sensor,current level,digital signal,power dissipation,scan chain readout,self-calibration circuit,
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