A novel technique to measure the contact resistance of a MOSFET

IEEE Transactions on Electron Devices(1987)

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摘要
A new technique is proposed to measure the contact resistance of a MOSFET by using a tester electrically converted from an existing MOSFET. Experiments have confirmed the applicability of this simple and easy technique. The attractiveness of this technique includes the ability to measure extremely low specific contact resistivity, and the capability of measurements on self-aligned silicided contac...
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关键词
conductivity,testing,voltage,contact resistance,transmission line theory,kelvin
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