Dielectric response of piezoelectric ceramics at low voltage excitations

An improved model is proposed for the interpretation of the dielectric response of a piezoelectric lead zirconate titanate (PZT) ceramic at low voltage excitations appropriate for microdevices by considering multiple relaxation processes. The model parameters are optimised in order to achieve a satisfactory agreement between the predicted values and experimental data obtained from room temperature measurements on a commercially available PZT-805 ceramic sample.