Simplified ohmic and Schottky contact formation for field effect transistors using the single layer integrated metal field effect transistor (SLIMFET) process

IEEE Transactions on Semiconductor Manufacturing(1995)

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摘要
A new III-V semiconductor device fabrication process for GaAs-based field effect transistors (FET) is presented which uses a single lithographic process and metal deposition step to form both the ohmic drain/source contacts and the Schottky gate contact concurrently. This single layer integrated metal FET (SLIMFET) process simplifies the fabrication process by eliminating an additional lithographi...
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关键词
Schottky barriers,FETs,Fabrication,Metallization,Ohmic contacts,Gallium arsenide,MESFETs,III-V semiconductor materials,Semiconductor devices,Annealing
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