Comparison Of Structures And Properties Of Bst Thin Films Grown On Lao And Mao Substrates

The crystal structure and in-plane dielectric and ferroelectric properties of Ba0.7Sr0.3TiO3 (BST 70/30) thin films epitaxially grown on LaAlO3 (LAO) and MgAl2O4(MAO) (001) single crystal substrates by PLD are compared. Through X-ray diffraction it is found that BST thin film in both heterostructures has an elongated in-plane lattice parameter, which results in a shifted Curie temperature (Tc = 70 degrees C for BST on LAO and 78 degrees C for BST on MAO) and enhanced ferroelectric properties (Pr = 8.4 mu C/cm(2) for BST on LAO and 7.1 mu C/cm(2) for BST on MAO).