Modelling Circuit Performance Variations Due to Statistical Variability: Monte Carlo Static Timing Analysis

Michael Merrett,Plamen Asenov,Yangang Wang,Mark Zwolinski,Dave Reid,Campbell Millar,Scott Roy,Zhenyu Liu,Steve Furber,Asen Asenov

2011 Design, Automation &amp Test in Europe（2011）

引用 19|浏览32

关键词

CMOS integrated circuits,MOSFET,Monte Carlo methods,CMOS integrated circuits,MOSFET,Monte Carlo static timing analysis,circuit performance variations,corner based analysis,deca-nano domain,digital circuit timing,large-scale statistical transistor simulations,power consumption,random intra-die statistical variations,standard cell characterisation tools,statistical variability

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