I/sub DDQ/ test using built-in current sensing of supply line voltage drop
ITC(2005)
摘要
A practical built-in current sensor (BICS) is described that senses the voltage drop on supply lines caused by quiescent current leakage. This noninvasive procedure avoids any performance degradation. The sensor performs analog-to-digital conversion of the input signal using a stochastic process, with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency noise and drift. The measurement results of a 350 nm test chip are described. The sensor achieves a resolution of 182 muA, with the promise of much higher resolution
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关键词
integrated circuit testing,quiescent current testing,analogue-digital conversion,analog-to-digital conversion,noninvasive procedure,voltage drop,350 nm,built-in current sensor,bics,digital chopping,iddq testing,input signals,scan chain readout,electric sensing devices,built-in current sensing,built-in self test,stochastic process,182 mua,self-calibration,electric potential,detectors,chip,voltage,low frequency noise
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