Self Test Architecture for Testing Complex Memory Structures

ITC, pp. 547-547, 2000.

Cited by: 14|Views2
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Abstract:

The structural complexity and test challenges of complexdependent memory structures are described. An isolationstrategy to minimize the test logic overhead and delay penaltyis presented. A set of custom memory test algorithms isdesigned to test the memory cell, bridging and multi-portfaults in complex dependent memory structures. A novelp...More

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