Nanometer-Scale Depth Resolution and Sensitive Surface Analysis Using Laser Ablation Atomic Fluorescence Spectroscopy

An extremely high-resolution, nanometer-resolution, solid-surface trace element detection has been demonstrated. Nanometer-thinned pulsed laser ablation was combined with extremely sensitive laser-induced fluorescence spectroscopy, and depth resolution of 3.6 nm was experimentally demonstrated for the first time on sodium detection in polymeric samples. An extremely high absolute detection limit of 25.2 fg was also obtained, and a theoretical calculation program was also generated to analyze the results.