Differential Resistance Testing for InP-Based Semiconductor Optical Amplifiers
Journal of Lightwave Technology(2009)
摘要
A new method for electrically measuring optical performance degradation in InP-based semiconductor optical amplifiers (SOAs) is presented. It is shown that this degradation can be directly qualified through measurements of electrical subthreshold differential resistance. Experimental measurements are presented along with a theoretical analysis to demonstrate a proposed aging signature. Furthermore, two system designs are presented based on using this signature for enhancing device testability.
更多查看译文
关键词
Semiconductor device testing,Semiconductor optical amplifiers,Electrical resistance measurement,Electric resistance,Electric variables measurement,Degradation,Stimulated emission,Aging,System analysis and design,System testing
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络