Static Compaction of Delay Tests Considering Power Supply Noise
VTS, pp. 235-240, 2005.
EI
Abstract:
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise estimation tool has been built and integrated into the compaction process. Compaction results for KLPG delay tests for ISCAS89 circuits under different power grid e...More
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