Characterization And Improvement Of A Ybco Multilayer Film Process For Hts Circuit Applications

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY(1997)

引用 15|浏览1
暂无评分
摘要
We have developed a 2'' multilayer HTS integrated circuit process which contains up to three superconducting YBCO layers, epitaxial dielectric (SrTiO3 or SrTiO3 + Sr2AlTaO6 combination), Ag wiring, an integrated resistor and non-epitaxial SixNy dielectric. We have incorporated the use of n-factorial and Taguchi designed experiments to develop and optimize various aspects of this process, This article highlights the designed experiments which addressed fabrication issues for HTS superconducting crossovers, dielectric integrity, and HTS/Ag metal contact resistance.
更多
查看译文
关键词
integrated circuit,dielectrics,contact resistance,high temperature superconductors,sin,ag,design optimization,resistors
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要