Parameter variations and impact on circuits and microarchitecture

Shekhar Borkar,Tanay Karnik,Siva Narendra,Jim Tschanz,Ali Keshavarzi,Vivek De

DAC（2003）

引用 1896|浏览362

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摘要

Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.

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关键词

possible solution,higher frequency bin,parameter variation,major challenge,temperature variation,future high performance microprocessors,circuits,frequency,voltage,temperature,performance,vlsi,design,cmos technology,microarchitecture,parameter estimation,design for manufacture,microcomputers,very large scale integration,body

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