Longest-path selection for delay test under process variation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 1924-1929, 2006.

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Under manufacturing process variation, a path through a net is called longest if there exists a process condition under which the path has the maximum delay among all paths through the net. There are often multiple longest paths for each net, due to different process conditions. In addition, a local defect, such as resistive open or a res...More



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