Core-level X-ray photoemission spectral shift through the successive phase transitions in layered TlInS2

Thin Solid Films(2008)

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摘要
Temperature-dependent change in core-level electronic structures of the layered semiconductor-ferroelectric TlInS2 with incommensurate phase has been investigated by means of X-ray photoemission spectroscopy. The temperature dependence of the relative peak position for each core level (Tl 4f, In 3d and S 2p) is found to differ very much in the regions bordering each other at the normal-incommensurate phase transition point of 218 K. The obtained data suggest that the charge distribution in TlInS2 dramatically changes upon passing from the normal phase (T>218 K) to the spatially modulated incommensurate phase (T<218 K).
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关键词
X-ray photoemission spectroscopy (XPS),TlInS2,Phase transition,Incommensurate phase
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