A Prototype Of A Wireless-Based Test System
20TH ANNIVERSARY IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS(2007)
摘要
In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.
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关键词
decoding,prototypes,registers,system testing
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