Dependence Of 1/F Noise In Crsi2 Films On The Temperature-Coefficient Of The Resistance

1 ⨍ in chromium silicide films with various values of the temperature coefficient of the resistance was measured. With the value 3 × 10 ×6 K −1 for the temperature coefficient of the resistance, R −1 ( dR dT ) , 1 f noise was higher than with the value 35 × 10 −6 K ×1 . This is in disagreement with the theory of equilibrium fluctuations in temperature.