Imaging pattern formation: Bridging the pressure gap
Applied Physics A-materials Science & Processing(1995)
摘要
Two surface-sensitive optical imaging methods, Ellipso-Microscopy for surface Imaging (EMSI) and Reflection Anisotropy Microscopy (RAM) are introduced. They allow imaging of pattern formation on surfaces, e.g., due to submonolayer coverages of adsorbates, at any arbitrary pressure.
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