Combining Dynamic Slicing And Mutation Operators For Esl Correction

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)(2012)

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摘要
Verification is increasingly becoming the bottleneck in designing digital systems. In fact, most of the verification cycle is not spent on detecting the occurrences of errors but on debugging, consisting of locating and correcting the errors. However, automated design-error debug, especially at the system-level, has received far less attention than error detection. Current paper presents an automated approach to correcting system-level designs. We propose dynamic-slicing and location-ranking-based method for accurately pinpointing the error locations combined with a dedicated set of mutation operators for automatically proposing corrections to the errors. In order to validate the approach, experiments on the Siemens benchmark set have been carried out. The experiments show that the proposed method is able to correct three times more errors compared to the state-of-the-art mutation-based correction methods while examining fewer mutants.
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关键词
electronic design automation,error detection,algorithm design,benchmark testing,heuristic algorithm,algorithm design and analysis,debugging,error correction,system level design
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