Cross Layer Resiliency In Real World
DATE '14: Proceedings of the conference on Design, Automation & Test in Europe（2014）
摘要
Resilience at different design hierarchies will be needed in Complex SoCs to handle failures due to variability, reliability and design errors (logical or electrical). The main reasons for the marginal behavior are sheer design complexity, uncertainties in manufacturing processes, temporal variability and operating conditions. In this session, we will cover the basics of cross layer resiliency and explore the reliability challenges in both embedded processors as well as large scale computing resources.
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关键词
design error,different design hierarchy,sheer design complexity,reliability challenge,temporal variability,Complex SoCs,cross layer resiliency,embedded processor,large scale computing resource,main reason,real world
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