Efficient Transient Simulation For Transistor-Level Analysis
ASPDAC05: Asia and South Pacific Design Automation Conference Shanghai China January, 2005(2005)
摘要
In this paper, we introduce an efficient transistor level simulation tool with SPICE-accuracy for deep-submicron(DSM) VLSI circuits with strong coupling effects. The new approach uses multigrid for large networks of power/ground, clock and signal interconnect. Transistor devices are integrated using a novel two-stage Newton-Raphson method to dynamically model the linear network and nonlinear devices interface. Orders of magnitude speedup over Berkeley SPICE3 is observed for sets of DSM design circuits.
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关键词
Newton-Raphson method,SPICE,VLSI,circuit simulation,integrated circuit modelling,transient analysis,Berkeley SPICE3,DSM design circuits,Newton-Raphson method,coupling effects,deep-submicron VLSI circuits,linear network,nonlinear devices interface,transient simulation,transistor-level analysis,
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