The stabilized reference-line (SRL) technique for scaled DRAMsK. Tsuchida,Y. Oowaki,Masako Ohta,D. Takashima,S. Watanabe, K. Ohuchi,F. MasuokaIEEE Journal of Solid-state Circuits（1990）引用 11|浏览4暂无评分关键词capacitance,interference,vlsi,degradation,voltage,scaling,noise reduction,testingAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
