Space Evaluation of P-HEMT MMIC Process PH15

The evaluation of UMS 0.15 mu m gate-length P-HEMT MMIC technology PH15 is presented. This evaluation follows the requirements of the European Space Agency standards and features high temperature storage tests, DC life-tests and RF life-tests. These tests are performed on dedicated vehicles, specifically designed to check the limits of the technology in tens of reliability. Several wear-out mechanisms have been evidenced, such as the ohmic contact degradation, the interconnects metal electromigration, and hot electron effects. The useful life failure rate has been computed from the extensive life-testing of the Representative Integrated Circuit (RIC). From the results of the evaluation, it is concluded that PH15 reliability is compatible with the space users requirements.