Performance Of Microdot (Mdot) Detectors With Conductive Coating Of Doped Amorphous Silicon Carbide (A-Si : C : H)

Hs Cho,Ws Hong,J Kadyk,V Perez-Mendez

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT（1999）

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摘要

A conductive coating of doped amorphous silicon carbide (a-Si:C:H) has been used in the fabrication of microdot (MDOT) detectors, to minimize the defocusing, away from the anodes, of the drifting primary electrons. This defocusing is caused by the existence of the readout line passing below the insulating layer. The defocusing effect and other effects of the conductive coating on the performance of these detectors fabricated in this way have been investigated. (C) 1999 Elsevier. Published by Elsevier Science B.V. All rights reserved.

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关键词

microdot detectors, defocusing, conductive coating, doped amorphous silicon carbide

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