EM emission modeling for secure IC design
2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)(2022)
摘要
For some decades now, electromagnetic radiations have not only generated electromagnetic compatibility problems but are a critical threat also for secure IC designers. In fact, these radiations can be collected, with an EM probe, to perform electromagnetic side-channel attacks (EM SCA), in order to retrieve secure data from ICs. Within this context, this paper aims to propose an industrial simulat...
更多查看译文
关键词
Analytical models,Metals,Voltage,Side-channel attacks,Electromagnetic compatibility,Finite element analysis,Magnetic fields
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要