Soft X-Ray Emission Spectroscopic Analysis of Pt Silicides ($\bf Pt_{2}Si$, PtSi)

We have studied the partial valence band density of states (VB-DOS) of Pt-silicides by using soft X-ray emission spectroscopy (SXES). Si Kbeta emission spectra of Pt2Si and PtSi provide information on the gi p partial VB-DOS, showing the clear bonding and antibonding states. The contribution of Si s and/or d states to the upper part of VB-DOS has also been observed from the Si L2,3 emission spectra of Pt2Si and PtSi. Such a contribution of the Si s and/or d state to the upper part of the VB-DOS has not been predicted by previous theoretical studies.