At-speed test for path delay faults using practical techniques

DBT '04 Proceedings of the 2004 IEEE International Workshop on Defect Based Testing, pp. 61-66, 2004.

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Abstract:

A practical built-in current sensor (BICS) design is described in This work. This sensor system is able to monitor the IDDQ at a resolution level of 10 /spl mu/A. This system can translate the current level into a digital signal, with scan chain readout. ...

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