Fractal Character Of Cold-Deposited Silver Films Determined By Low-Temperature Scanning-Tunneling-MicroscopyConstantine Douketis,Zhouhang Wang,Tom Haslett,Martin MoskovitsPHYSICAL REVIEW B(1995)引用 159|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要