A Deterministic Digital Background Calibration Technique for VCO-Based ADCs

J. Solid-State Circuits(2014)

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摘要
This paper presents a digital background calibration technique to realize a linear voltage-controlled-oscillator (VCO) based ADC. The distortion caused due to the VCO's nonlinear tuning characteristics is eliminated by introducing an inverse voltage-to-frequency transfer function in the signal path. The proposed calibration unit runs in the background and detects the inverse transfer function using a highly digital frequency locked loop. Like many other VCO-based ADCs, the proposed technique does not require analog building blocks such as operational amplifiers, multi-bit feed-back DACs etc., and retains the scaling friendly properties. Implemented in a 90 nm CMOS process, the on-chip calibration improves SNDR of an open-loop VCO-based ADC from 46 dB to more than 73 dB in 5 MHz signal bandwidth while consuming 4.1 mW power. The ADC achieves a figure-of-merit of 91-112 fJ/conv-step for different input frequencies.
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cmos process,power 4.1 mw,cmos integrated circuits,signal path,highly digital frequency locked loop,calibration,analogue-digital conversion,background calibration,voltage-controlled oscillators,sndr,transfer functions,on-chip calibration,scaling friendly properties,analog to digital converter,nonlinear tuning characteristics,figure-of-merit,deterministic digital background calibration technique,inverse voltage-to-frequency transfer function,linear voltage-controlled-oscillator,open-loop delta sigma,calibration unit,time based adc,frequency locked loops,size 90 nm,bandwidth 5 mhz,vco based adc,deterministic calibration,open-loop vco-based adc,radiation detectors,figure of merit,tuning
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