Variation and analog modeling.

CICC（2013）

引用 0|浏览12

暂无评分

摘要

AMS, RF, and memory circuits can be highly susceptible to performance degradation caused by process variation, thermal noise, and other non-idealities. This session presents recent advances in modeling these effects, gaining insight into their operation, and techniques to mitigate them.

查看译文

关键词

radio frequency,thermal noise,cmos integrated circuits,noise,semiconductor device modeling

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要