MULTIFUNCTION TEST-BENCH FOR HEAVY ION SOURCES

The new test-bench for heavy ion sources has been created in ITEP. It is planned to equip test-bench with a set of measurement devices to cover wide range of beam widths, divergences, durations, currents etc. It will provide measurements of different heavy ion beams parameters, particularly, emittance and charge state distribution. The last parameter may be measured both by the time-of-flight method and with the magnet analyzer. Two emittance measurement devices will be installed. It will be possible to use both slit/grid and CCD based "pepperpot" methods, which will give advantages of combination of classical emittance measurements with performance of the CCD based devices. The detailed description of test-bench and its equipment is presented. The first results at MEVVA ion source and beam investigations are discussed. TEST-BENCH STRUCTURE