Effect of diffraction and interference in submicron metal-semiconductor-metal photodetectors

Mohamed Arafa,Walter A. Wohlmuth,Patrick Fay,Ilesanmi Adesida

IEEE Transactions on Electron Devices（1998）

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摘要

As the dimensions of state-of-the art metal-semiconductor-metal photodetectors (MSMPD's) decrease, effects that are insignificant for relatively large geometries become significant in the optoelectronic performance of submicron MSMPD's. Accurate modeling of these effects Is necessary to precisely predict the performance of these devices by computer simulation. In this paper, a technique that accou...

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关键词

Diffraction,Interference,Predictive models,Art,Photodetectors,Geometry,Computer simulation,Indium gallium arsenide,Computational modeling,Electrodes

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