Ultra-low power electronics with Si/Ge tunnel FET

DATE(2014)

引用 40|浏览59
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摘要
Si/Ge Tunnel FET (TFET) with its subthermal subthreshold swing is attractive for low power analog and digital designs. Greater Ion/Ioff ratio of TFET can reduce the dynamic power in digital designs, while higher gm/IDS can lower the bias power of analog amplifier. However, the above benefits of TFET are eclipsed by MOSFET at a higher power/performance point. Ultra low power scalability of the key analog and digital circuits, SRAM and operational transconductance amplifier (OTA), with TFET is demonstrated. Analyzing a TFET based cellular neural network, this work shows the feasibility of ultra-low-power neuromorphic computing with TFET.
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关键词
Ge-Si alloys,MOSFET,SRAM chips,cellular neural nets,low-power electronics,operational amplifiers,semiconductor device reliability,MOSFET,OTA,SRAM,Si-Ge,TFET based cellular neural network,analog amplifier,analog circuits,analog designs,bias power,digital circuits,digital designs,dynamic power,neuromorphic computing,operational transconductance amplifier,performance point,power point,subthermal subthreshold swing,tunnel FET,ultra-low power electronics,Cellular neural network,Low power design,Operational transconductance amplifier,SRAM,Tunnel FET
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