Fault simulation and test generation for small delay faults

Fault simulation and test generation for small delay faults, 2006.

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摘要

Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they model only a subset of delay defect behaviors. To solve this problem, a more realistic delay fault model has been developed which models delay faults caused by the combination of spot defects and parametric process variati...更多

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