An Enhanced SRAM BISR Design with Reduced Timing Penalty

ATS '06 Proceedings of the 15th Asian Test Symposium(2006)

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摘要
Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% ...
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关键词
power reduction architecture,dominant factor,experimental result,sub-scan chain,transition monitoring window,Enhanced SRAM BISR Design,Reduced Timing
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