An Enhanced SRAM BISR Design with Reduced Timing Penalty
ATS '06 Proceedings of the 15th Asian Test Symposium(2006)
摘要
Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% ...
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关键词
power reduction architecture,dominant factor,experimental result,sub-scan chain,transition monitoring window,Enhanced SRAM BISR Design,Reduced Timing
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