K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits

WQ Qiu, J Wang,DMH Walker, D Reddy, XA Lu, Z Li,WP Shi,H Balachandran

ITC（2004）

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关键词

longest path,at-speed test strategy,existing test generation tool,reasonable test set size,test generation efficiency,test generation methodology,longest testable path,ISCAS89 benchmark circuit,fault site,full speed,K Longest Paths,Scan-Based Sequential Circuits,Test Generation

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