Testing Gbps Interfaces without a Gigahertz Tester
Design & Test of Computers, IEEE（2004）
摘要
These authors from Intel provide evidence for the rapid deployment of ICs equipped with high-speed serial interfaces. They argue that this constitutes a revolutionary functional and design paradigm shift, which in turn dictates a corresponding shift in test and DFT methods. They also review various approaches and discuss the tradeoffs they experienced in testing actual devices.
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关键词
corresponding shift,rapid deployment,testing gbps interfaces,actual device,gigahertz tester,dft method,various approach,design paradigm shift,high-speed serial interface,logic design,system design
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