REDO-random Excitation and Deterministic Observation-First Commercial Experiment

MR Grimaila,S Lee,J Dworak,KM Butler, B Stewart,H Balachandran, B Houchins,V Mathur,J Park,LC Wang,MR Mercer

Dana Point, CA（1999）

Cited 145|Views0

Key words

defective part level,non-target defect detection,non-target detection experiment,surrogate detection,test pattern,test pattern generation technique,DC stuck-at,stuck-at fault,REDO-based pattern,art tool,Deterministic Observation,First Commercial Experiment,Probabilistic Excitation

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