Developing a concurrent methodology for standard-cell library generation

Donald G. Baltus,Thomas Varga,Robert C. Armstrong,John Duh,T. G. Matheson

DAC（1997）

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摘要

This paper describes the development of a concurrentmethodology for standard cell library generation. Use of anovel physical design automation method enables a high degreeof concurrency among process, circuit, and layout development.In addition to reducing overall time-to-market, the newmethod allows optimization to occur simultaneously across thecircuit, layout, and process design spaces. The result is librarieswith improved density, circuit performance, and process yield.

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关键词

circuit performance,high degreeof concurrency,concurrent methodology,standard cell library generation,layout development,overall time-to-market,process yield,anovel physical design automation,standard-cell library generation,librarieswith improved density,process design space,fabrication,covering problems,logic,concurrent computing,design optimization,physical design,integer linear programming,constraint optimization,automation,process design,circuits

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