Pseudorandom built-in self-test methodology and implementation for the IBM RISC System/6000 processor

IBM Journal of Research and Development(1990)

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摘要
This paper describes a unified self-test and system bring-up methodology. The components involved include a common on-chip processor (COP) that executes the chip self-test sequence and provides an interface to the COP bus, a serial bus (COP bus) that links the chips to OCS and ESP, an on-card sequencer (OCS) that controls the self-test and system initialization sequences, and an engineering suppor...
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IBM RISC System,Pseudorandom built-in self-test methodology
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