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Research Interests

Papers共 227 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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The UIS Withstand Capability and Device Failure Mechanism of 650 V P-Gan Gate HEMTs
Qihang Huang, Luanxi Ma, Yanyu Nie, Shuting Huang, Jianggen Zhu,Yu Shi, Rongxin Du, David Zhou, Yuxi Wan,Bo Zhang,Qi Zhou
2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)pp.1-3, (2024)
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A Novel Snapback-Free Double-RESURF Reverse-Conducting LIGBT with Dual Conduction Paths
Yun Xia, Yuxi Wan, Wei Zeng,Yu Shi, Xiaoping Wang,Wei Liu, Haizhao Zhi, Ziwei Zhou, Xixi Luo, Ruize Sun, Xiaoming Wang,Yan Wang,Wanjun Chen
2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)pp.1-3, (2024)
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Investigation of Threshold Voltage Instability in P-Gan Gate HEMTs under Surge Current Stress
Xiaoming Wang,Yu Shi, David Zhou, Haizhao Zhi,Yun Xia, Yuxi Wan, Ruize Sun,Xinghuan Chen,Wanjun Chen,Bo Zhang
2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)pp.1-3, (2024)
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Author Statistics

#Papers: 227

#Citation: 3669

H-Index: 30

G-Index: 55

Sociability: 6

Diversity: 4

Activity: 35

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  • 学生
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