Shih, Y.H. - Emerging Cent Lab, Macronix Int Co Ltd

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论文共 31 篇作者统计合作学者相似作者

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Editorial Special Issue on "memory Devices and Technologies for the Next Decade"

Christian Monzio Compagnoni,Jinfeng Kang,Yen-Hao Shih, Pei-Ying (Penny) Du,Tae-Hun Kim,Chandra Mouli,Joshua Yang,Kaushik Roy

IEEE TRANSACTIONS ON ELECTRON DEVICES（2020）

引用2浏览0EIWOS引用

A Promising Solution to Reduce Plasma Induced Damage (PID) of High Density Plasma (HDP) Oxide Without Sacrificing the Gap-Fill and Throughput Performance — Chin-Tsan Yeh

Chin-Tsan Yeh, Chia-Sheng Yu,Ying-Tso Chen,Yen-Hao Shih,Chih-Yuan Lu

2017 JOINT INTERNATIONAL SYMPOSIUM ON E-MANUFACTURING AND DESIGN COLLABORATION (EMDC) & SEMICONDUCTOR MANUFACTURING (ISSM) (2017)

引用1浏览0EIWOS引用

Z-Interference and Z-Disturbance in Vertical Gate-Type 3-D NAND

Teng-Hao (Elton) Yeh, Chen,Tzu-Hsuan (Bruce) Hsu, Pei-Ying (Penny) Du,Chih-Chang Hsieh,Hang-Ting Lue,Yen-Hao Shih,Ya-Chin King,Chih-Yuan Lu

IEEE Transactions on Electron Devices（2016）

引用7浏览0EIWOS引用

A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (dt) Be-Sonos Performance

Roger Lo,Pei-Ying Du,Tzu-Hsuan Hsu,Chen-Jun Wu,Jung-Yi Guo,Chun-Min Cheng,Hang-Ting Lue,Yen-Hao Shih, Tuo-Hung Hou,Kuang-Yeu Hsieh,Chih-Yuan Lu

2015 IEEE 7TH INTERNATIONAL MEMORY WORKSHOP (IMW)（2015）

引用3浏览0EIWOS引用

Study of the Programming Sequence Induced Back-Pattern Effect in Split-Page 3D Vertical-Gate (VG) NAND Flash

Chen,Hang-Ting Lue,Kuo-Pin Chang,Yi-Hsuan Hsiao,Chih-Chang Hsieh,Yen-Hao Shih,Chih-Yuan Lu

PROCEEDINGS OF TECHNICAL PROGRAM - 2014 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPL...（2014）

引用13浏览0EIWOS引用

Overview of 3D NAND Flash and Progress of Split-Page 3D Vertical Gate (3DVG) NAND Architecture

Pei-Ying Du,Hang-Ting Lue,Yen-Hao Shih,Kuang-Yeu Hsieh,Chih-Yuan Lu

2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT) (2014)

引用17浏览0EIWOS引用

Study of the Impact of Charge-Neutrality Level (CNL) of Grain Boundary Interface Trap on Device Variability and P/E Cycling Endurance of 3D NAND Flash Memory

Chen,Hang-Ting Lue,Yi-Hsuan Hsiao,Xi-Wei Lin, Jacky Huang,Yen-Hao Shih,Chih-Yuan Lu

2014 Symposium on VLSI Technology (VLSI-Technology) Digest of Technical Papers（2014）

引用6浏览0EIWOS引用

Distribution of Nanoscale Nuclei in the Amorphous Dome of a Phase Change Random Access Memory

Bong-Sub Lee,Kristof Darmawikarta,Simone Raoux,Yen-Hao Shih,Yu Zhu,Stephen G. Bishop,John R. Abelson

Applied Physics Letters（2014）

引用30浏览0引用

A Novel Double-Trapping BE-SONOS Charge-Trapping NAND Flash Device to Overcome the Erase Saturation Without Using Curvature-Induced Field Enhancement Effect or High-K (hk)/metal Gate (MG) Materials

Hang-Ting Lue,Roger Lo,Chih-Chang Hsieh,Pei-Ying Du,Chih-Ping Chen,Tzu-Hsuan Hsu,Kuo-Ping Chang,Yen-Hao Shih,Chih-Yuan Lu

2014 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) (2014)

引用10浏览0EIWOS引用

Trapping-free String Select Transistors and Ground Select Transistors for Vg-type 3D NAND Flash Memory

Yan-Ru Chen,Chen-Jun Wu,K-P Chang,Chih-Ping Chen,Tzu-Hsuan Hsu,Yi-Hsuan Hsiao, F-N Tsai,Mars Yang,Yu-De Huang,Lo-Yueh Lin,Tahone Yang, Chia-Jun Chiou, Shih-Hong Chen,Hang-Ting Lue,Yen-Hao Shih,Chih-Yuan Lu

International Memory Workshoppp.1-4, (2014)

引用2浏览0EIWOS引用

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