检索
AI 对话
analysis
趋势分析
编组
开放平台
more
更多
排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
VIPCreated with Sketch.
研究兴趣

论文共 19 篇作者统计合作学者相似作者

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Characterization and Modeling of Hot Carrier Degradation Under Dynamic Operation Voltage
Yanning Chen, Kai Wang,Jin Shao, Fang Liu,Xinhuan Yang, Jianyu Zhang,Qianqian Sang,Chuanzheng Wang,Yuanfu Zhao
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITYno. 1 (2024): 123-128
引用0浏览0EIWOS引用
0
0
A Highly Collaborative EDA Toolset for Design Technology Co-Optimization Towards Analog and Mixed Signal Circuits
Yali Shao,Yanning Chen,Meigen Shen, Dong Zhang, Yaoming Xie,Dongmei Li, Yingzong Liang, Boming Chi, Fang Liu,Dongyan Zhao, Qingmeng Meng, Zezhou Chang
2023 International Symposium of Electronics Design Automation (ISEDA)pp.11-16, (2023)
引用0浏览0EIWOS引用
0
0
An IGBT Desaturation Protection Technique With Leading Edge Blanking
Yanning Chen,Yali Shao, Fang Liu,Meigen Shen, Yaoming Xie,Dongmei Li, Yingzong Liang, Boming Chi
2023 International Applied Computational Electromagnetics Society Symposium (ACES-China)pp.1-4, (2023)
引用0浏览0EIWOS引用
0
0
A Equivalent Circuit for Rapid Reproduction of IGBT Transient Thermal Impedance Graph
Yingzong Liang,Yanning Chen,Dongyan Zhao,Yali Shao, Fang Liu, Chao Xiao, Yongfu Li
2023 International Symposium of Electronics Design Automation (ISEDA)pp.241-245, (2023)
引用0浏览0EIWOS引用
0
0
A Novel Method for Automatically Extracting Breakdown Voltage of Zener Diodes from I-V Characteristics Curves
Yingzong Liang, Dongrong Zhang,Yanning Chen,Dongyan Zhao,Yali Shao, Kai Wang
2023 International Symposium of Electronics Design Automation (ISEDA)pp.195-198, (2023)
引用0浏览0EIWOS引用
0
0
Hot-Carrier Injection Degradation of 1.8V nMOSFET and a New Predication Model Based on LSTM
Yingzong Liang,Yanning Chen, Fang Liu,Yali Shao, Yongfeng Deng, Xiangbin Lu, Bo Cao
2023 International Applied Computational Electromagnetics Society Symposium (ACES-China)pp.1-3, (2023)
引用0浏览0EIWOS引用
0
0
Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI Stress Based on Low-Frequency Noise
Yi Jiang,Yanning Chen, Fang Liu, Bo Wu, Yongfeng Deng,Junkang Li,Dawei Gao,Rui Zhang
2023 International Conference on IC Design and Technology (ICICDT)pp.120-123, (2023)
引用0浏览0EIWOS引用
0
0
A 0.8-6 GHz Flat High Gain Inductorless LNA in 180-nm BiCMOS
Dongyan Zhao,Yanning Chen, Shuaipeng Wang, Jinghai Shao, C. F. Li, Zheng‐Wen Fu
Authorea (Authorea) (2023)
引用0浏览0引用
0
0
A Digital Controlled Desaturation Detection with Adjustable Blanking Time for IGBT Driver
Yanning Chen,Yali Shao, Fang Liu,Zhen Fu, Quan Zhang, Peng Xu,Meigen Shen, Yaoming Xie,Dongmei Li,Licheng Wang, Xiangbin Lu, Wen Yu,
2023 26th International Conference on Electrical Machines and Systems (ICEMS)pp.3801-3805, (2023)
引用0浏览0EIWOS引用
0
0
Design and verification of a new electromagnetic shielding material suitable for QFP packaging
Haichao Huang,Dongyan Zhao,Yanning Chen,Zhen Fu,Shuaipeng Wang, Xiaofeng Cheng
2022 23rd International Conference on Electronic Packaging Technology (ICEPT)pp.1-5, (2022)
引用0浏览0EIWOS引用
0
0
加载更多
作者统计
  • 合作者
  • 学生
  • 导师
暂无相似学者，你可以通过学者研究领域进行搜索筛选
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果，我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问，可以通过电子邮件方式联系我们：report@aminer.cn