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Yang Yang

ECE Dept., George Mason Univ., Fairfax, VA, USA|c|

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Gate dielectric breakdown protection during ESD events

Michel J Aboukhalil, James P Di Sarro,Robert J Gauthier,Junjun Li,Souvick Mitra,Yang Yang

(2014)

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Characterization of high-k/metal gate stack breakdown in the time scale of ESD events

Yang Yang,James Di Sarro,Robert J Gauthier,Kiran V Chatty, Junjun Li,Rahul Mishra,Souvick Mitra,Dimitris E Ioannou

Reliability Physics Symposium, pp.846-852, (2010)

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