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In research, I am striving to develop innovative solutions to test generation, design for test, and fault diagnosis for VLSI circuits. My research goal is to achieve higher test quality at lower test costs through test technology innovations. In education, I am striving to arm my students with not only abundant technical knowledge but also strong problem-solving capability, creativity, team spirit, as well as presentation and communication skills. My educational goal is to help my students to thrive, not just survive, in today's competitive and global professional environments.
Please start your surfing through my homepage. If you have any questions, requests, comments, or just want to say hello, please don't hesitate to do so by sending me an email (wen at cse kyutech ac jp) or finding me at LinkedIn (https://www.linkedin.com/in/xiaoqing-wen-27109915). There is no greater pleasure for me than hearing from friends like you.
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IEEE Transactions on Aerospace and Electronic Systemsno. 99 (2024): 1-10
crossref(2024)
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSno. 1 (2024): 116-127
Aibin Yan, Zhixing Li, Zhongyu Gao,Jing Zhang,Zhengfeng Huang,Tianming Ni,Jie Cui,Xiaolei Wang,Patrick Girard,Xiaoqing Wen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsno. 99 (2024): 1-1
ACM Transactions on Design Automation of Electronic Systemsno. 1 (2024): 1:1-1:3
Integrationpp.102190, (2024)
2023 IEEE International Symposium on Circuits and Systems (ISCAS)pp.1-5, (2023)
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