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Zhuo Li

Dept. of Electrical Engineering, Texas A&M University, College Station, TX

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K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits

Wangqi Qiu,Jing Wang,D M H Walker,Dikpal Reddy,Xiang Lu,Zhuo Li,Weiping Shi,Hari Balachandran

ITC, pp.223-231, (2004)

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